A Self-Adaptive SEU Mitigation Scheme for Embedded Systems in Extreme Radiation Environments

When electronic systems are working in radiation environments, transient errors, and permanent errors may occur. Static random-access memory (SRAM) has been the one of most significant parts various semiconductor chips for its high performance logic density features. However, because their dedicated circuits, SRAMs sensitive to effects. In this article, a portable scheme combined with error correcting code (ECC) refreshing techniques is proposed correct mitigate accumulation extreme environments. Since small transparent other modules no additional latency introduced, it therefore can be easily applied system where hardware designed fixed reading writing latency. We evaluated design by simulation fault injection platform experiments neutron facility. The results obtained experiment, flux particles $5 \times {\rm 10^6\text{ cm}^2. \ s^{-1}}$ , show that number bit-flips 32 kB self-refresh ECC RAM on Xilinx Artix-7 FPGA remains zero, while unhardened rose 1.5 h.